Coverart for item
The Resource Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM, R. F. Egerton

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM, R. F. Egerton

Label
Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM
Title
Physical principles of electron microscopy
Title remainder
an introduction to TEM, SEM, and AEM
Statement of responsibility
R. F. Egerton
Creator
Author
Subject
Language
eng
Summary
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy--Book cover
Cataloging source
PU
http://library.link/vocab/creatorName
Egerton, R. F
Illustrations
illustrations
Index
index present
Literary form
non fiction
Nature of contents
bibliography
http://library.link/vocab/subjectName
Electron microscopy
Label
Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM, R. F. Egerton
Instantiates
Publication
Copyright
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier MARC source
rdacarrier
Content category
text
Content type MARC source
rdacontent
Contents
An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Special Topics -- Appendix: Mathematical Derivations
Dimensions
24 cm
Edition
Second edition
Extent
xi, 196 pages)
Isbn
9783319398761
Isbn Type
(print)
Media category
unmediated
Media MARC source
rdamedia
Other physical details
illustrations
Label
Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM, R. F. Egerton
Publication
Copyright
Bibliography note
Includes bibliographical references and index
Carrier category
volume
Carrier MARC source
rdacarrier
Content category
text
Content type MARC source
rdacontent
Contents
An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Special Topics -- Appendix: Mathematical Derivations
Dimensions
24 cm
Edition
Second edition
Extent
xi, 196 pages)
Isbn
9783319398761
Isbn Type
(print)
Media category
unmediated
Media MARC source
rdamedia
Other physical details
illustrations

Library Locations

    • Manawatū LibraryBorrow it
      Tennent Drive, Palmerston North, Palmerston North, 4472, NZ
      -40.385340 175.617349
Processing Feedback ...