Coverart for item
The Resource MEMS and nanotechnology. : Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics /, Volume 5 :, Barton C. Prorok, LaVern Starman, editors

MEMS and nanotechnology. : Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics /, Volume 5 :, Barton C. Prorok, LaVern Starman, editors

Label
MEMS and nanotechnology. : Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics /, Volume 5 :
Title
MEMS and nanotechnology.
Title remainder
Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics /
Title number
Volume 5 :
Statement of responsibility
Barton C. Prorok, LaVern Starman, editors
Title variation
Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics
Creator
Contributor
Subject
Genre
Language
eng
Summary
The 16th International Symposium on MEMS and Nanotechnology, Volume 5 of the Proceedings of the 2015SEM Annual Conference & Exposition on Experimental and Applied Mechanics, the fifth volume of nine from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of areas, including: Microscale and Microstructural Effects on Mechanical Behavior Dynamic Micro/Nanomechanics In-situ Techniques Mechanics of Graphene Indentation and Small Scale Testing MEMS
Member of
Dewey number
620.5
Index
no index present
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2015
http://bibfra.me/vocab/lite/meetingName
Annual Conference on Experimental and Applied Mechanics
Nature of contents
  • dictionaries
  • bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Prorok, Barton C.,
  • Starman, LaVern A.,
Series statement
Conference proceedings of the society for experimental mechanics series
http://library.link/vocab/subjectName
  • Nanotechnology
  • Microelectromechanical systems
  • Mechanics, Applied
Label
MEMS and nanotechnology. : Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics /, Volume 5 :, Barton C. Prorok, LaVern Starman, editors
Instantiates
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references
Color
multicolored
Contents
  • Preface; Contents; Chapter 1: Oxide Driven Strength Degradation of (1 1 1) Silicon Surfaces; 1.1 Introduction; 1.2 Methods; 1.2.1 Sample Preparation; 1.2.2 Fracture Testing Procedure; 1.3 Experiments and Results; 1.3.1 Oxide Removal Experiment; 1.3.2 Atomistic Modeling of Oxidation Induced Strength Changes; 1.3.3 Artificial Oxidation Experiments; 1.4 Summary; References; Chapter 2: In Situ TEM Nanomechanical Testing; 2.1 Introduction; 2.2 Main Text; 2.2.1 Experimental Methods; 2.2.2 Dislocation Processes Associated with the PLC Effect in Al 5754; 2.2.3 Deformation in Nanowires
  • 2.3 Twinning in Nanopillars; 2.4 Future Directions; References; Chapter 3: Poissonś Ratio as a Damage Index Sensed by Dual-Embedded Fiber Bragg Grating Sensor; 3.1 Introduction; 3.2 Materials and Method; 3.2.1 Composite Materials; 3.2.2 Equipment and Test; 3.3 Results and Discussions; 3.4 Conclusion; References; Chapter 4: In Situ High-Rate Mechanical Testing in the Dynamic Transmission Electron Microscope; 4.1 Introduction; 4.2 Holder Design; 4.3 Sample Preparation; 4.3.1 Standard Machining and Electropolishing; 4.3.2 Femtosecond Laser Machining and Ion Milling
  • 4.3.3 Mounting Specimens for Testing; 4.3.4 Operating the Holder; 4.4 Dynamic Transmission Electron Microscope; 4.5 Preliminary Results; 4.6 Conclusion; References; Chapter 5: In Situ TEM Observation of Twinning, Detwinning and Retwinning in Quartz; 5.1 Introduction; 5.2 Experimental Procedure; 5.3 Results and Discussion; 5.4 Conclusion; References; Chapter 6: Nano to Macro: Mechanical Evaluation of Macroscopically Long Individual Nanofibers; 6.1 Introduction; 6.2 Methods of Mechanical Testing of 1D Nanomaterials; 6.3 Control of Nanofiber Diameter
  • 6.4 The Protocol for Mechanical Testing and Data Reduction; 6.5 Future Challenges and Directions; 6.6 Conclusions; References; Chapter 7: Evaluating Pile-Up and Sink-In During Nanoindentation of Thin Films; 7.1 Introduction; 7.2 Experimental Procedure; 7.3 Results and Discussion; 7.4 Conclusions; References; Chapter 8: Tapered Cantilevered Bimorphs for Piezoelectric Energy Harvesting: Characterization with Impedance Spectroscopy; 8.1 Introduction; 8.2 Methodology; 8.3 Results and Discussion; 8.3.1 No Proof Mass; 8.3.2 2g proof mass; 8.3.3 4g Proof Mass; 8.4 Conclusions; References
  • Chapter 9: Time and Temperature Dependence of Stress Relaxation in Al and Al Alloy Thin Films Application for MEMS; 9.1 Introduction; 9.2 Experimental; 9.2.1 Sample Design and Fabrication; 9.2.2 Testing System; 9.3 Results; 9.4 Conclusions; References; Chapter 10: Detecting Interconnect Damage in Shock Using Acoustic Emission Detection; 10.1 Introduction; 10.2 Test and Data Reduction Methods; 10.3 Results; 10.4 Conclusions; References; Chapter 11: Application of Nanoindentation and Microdiffraction to Study Aging Effects in Lead Free Solder Interconnects; 11.1 Introduction
Control code
ocn927404653
Dimensions
unknown
Extent
1 online resource
File format
unknown
Form of item
online
Isbn
9783319224589
Level of compression
unknown
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)927404653
Label
MEMS and nanotechnology. : Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics /, Volume 5 :, Barton C. Prorok, LaVern Starman, editors
Publication
Copyright
Antecedent source
unknown
Bibliography note
Includes bibliographical references
Color
multicolored
Contents
  • Preface; Contents; Chapter 1: Oxide Driven Strength Degradation of (1 1 1) Silicon Surfaces; 1.1 Introduction; 1.2 Methods; 1.2.1 Sample Preparation; 1.2.2 Fracture Testing Procedure; 1.3 Experiments and Results; 1.3.1 Oxide Removal Experiment; 1.3.2 Atomistic Modeling of Oxidation Induced Strength Changes; 1.3.3 Artificial Oxidation Experiments; 1.4 Summary; References; Chapter 2: In Situ TEM Nanomechanical Testing; 2.1 Introduction; 2.2 Main Text; 2.2.1 Experimental Methods; 2.2.2 Dislocation Processes Associated with the PLC Effect in Al 5754; 2.2.3 Deformation in Nanowires
  • 2.3 Twinning in Nanopillars; 2.4 Future Directions; References; Chapter 3: Poissonś Ratio as a Damage Index Sensed by Dual-Embedded Fiber Bragg Grating Sensor; 3.1 Introduction; 3.2 Materials and Method; 3.2.1 Composite Materials; 3.2.2 Equipment and Test; 3.3 Results and Discussions; 3.4 Conclusion; References; Chapter 4: In Situ High-Rate Mechanical Testing in the Dynamic Transmission Electron Microscope; 4.1 Introduction; 4.2 Holder Design; 4.3 Sample Preparation; 4.3.1 Standard Machining and Electropolishing; 4.3.2 Femtosecond Laser Machining and Ion Milling
  • 4.3.3 Mounting Specimens for Testing; 4.3.4 Operating the Holder; 4.4 Dynamic Transmission Electron Microscope; 4.5 Preliminary Results; 4.6 Conclusion; References; Chapter 5: In Situ TEM Observation of Twinning, Detwinning and Retwinning in Quartz; 5.1 Introduction; 5.2 Experimental Procedure; 5.3 Results and Discussion; 5.4 Conclusion; References; Chapter 6: Nano to Macro: Mechanical Evaluation of Macroscopically Long Individual Nanofibers; 6.1 Introduction; 6.2 Methods of Mechanical Testing of 1D Nanomaterials; 6.3 Control of Nanofiber Diameter
  • 6.4 The Protocol for Mechanical Testing and Data Reduction; 6.5 Future Challenges and Directions; 6.6 Conclusions; References; Chapter 7: Evaluating Pile-Up and Sink-In During Nanoindentation of Thin Films; 7.1 Introduction; 7.2 Experimental Procedure; 7.3 Results and Discussion; 7.4 Conclusions; References; Chapter 8: Tapered Cantilevered Bimorphs for Piezoelectric Energy Harvesting: Characterization with Impedance Spectroscopy; 8.1 Introduction; 8.2 Methodology; 8.3 Results and Discussion; 8.3.1 No Proof Mass; 8.3.2 2g proof mass; 8.3.3 4g Proof Mass; 8.4 Conclusions; References
  • Chapter 9: Time and Temperature Dependence of Stress Relaxation in Al and Al Alloy Thin Films Application for MEMS; 9.1 Introduction; 9.2 Experimental; 9.2.1 Sample Design and Fabrication; 9.2.2 Testing System; 9.3 Results; 9.4 Conclusions; References; Chapter 10: Detecting Interconnect Damage in Shock Using Acoustic Emission Detection; 10.1 Introduction; 10.2 Test and Data Reduction Methods; 10.3 Results; 10.4 Conclusions; References; Chapter 11: Application of Nanoindentation and Microdiffraction to Study Aging Effects in Lead Free Solder Interconnects; 11.1 Introduction
Control code
ocn927404653
Dimensions
unknown
Extent
1 online resource
File format
unknown
Form of item
online
Isbn
9783319224589
Level of compression
unknown
Quality assurance targets
not applicable
Reformatting quality
unknown
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)927404653

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