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The Resource Electron Energy-Loss Spectroscopy in the Electron Microscope, by R.F. Egerton

Electron Energy-Loss Spectroscopy in the Electron Microscope, by R.F. Egerton

Label
Electron Energy-Loss Spectroscopy in the Electron Microscope
Title
Electron Energy-Loss Spectroscopy in the Electron Microscope
Statement of responsibility
by R.F. Egerton
Creator
Subject
Language
eng
Summary
To the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec­ troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev­ eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re­ searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi­ cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units
http://library.link/vocab/creatorName
Egerton, R. F
Dewey number
570.282
Index
no index present
Language note
English
Literary form
non fiction
Nature of contents
dictionaries
http://library.link/vocab/subjectName
  • Life sciences
  • Analytical biochemistry
  • Microscopy
  • Surfaces (Physics)
Label
Electron Energy-Loss Spectroscopy in the Electron Microscope, by R.F. Egerton
Instantiates
Publication
Antecedent source
file reproduced from original
Bibliography note
Includes bibliographical references and index
Color
mixed
Contents
1. An Introduction to Electron Energy-Loss Spectroscopy -- 2. Instrumentation for Energy-Loss Spectroscopy -- 3. Electron Scattering Theory -- 4. Quantitative Analysis of the Energy-Loss Spectrum -- 5. Applications of Energy-Loss Spectroscopy -- Appendix A. Relativistic Bethe Theory -- Appendix B. Computer Programs -- B.1. Matrix Deconvolution -- B.2. Fourier-Log Deconvolution -- B.3. Kramers -- Kronig Analysis and Thickness Determination -- B.4. Fourier-Ratio Deconvolution -- B.5. Incident-Convergence Correction -- B.9. Lenz Elastic and Inelastic Cross Sections -- B.10. Conversion between Oscillator Strength and Cross Section -- B.11. Conversion between Mean Energy and Inelastic Mean Free Path -- Appendix C. Plasmon Energies of Some Elements and Compounds -- Appendix D. Inner-Shell Energies and Edge Shapes -- Appendix E. Electron Wavelengths and Relativistic Factors; Fundamental Constants -- References
Control code
ocn851789076
Dimensions
unknown
Edition
Second edition
Extent
1 online resource (xi, 485 pages)
File format
unknown
Form of item
online
Isbn
9781475750997
Level of compression
uncompressed
Note
SpringerLink
Quality assurance targets
unknown
Reformatting quality
access
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)851789076
Label
Electron Energy-Loss Spectroscopy in the Electron Microscope, by R.F. Egerton
Publication
Antecedent source
file reproduced from original
Bibliography note
Includes bibliographical references and index
Color
mixed
Contents
1. An Introduction to Electron Energy-Loss Spectroscopy -- 2. Instrumentation for Energy-Loss Spectroscopy -- 3. Electron Scattering Theory -- 4. Quantitative Analysis of the Energy-Loss Spectrum -- 5. Applications of Energy-Loss Spectroscopy -- Appendix A. Relativistic Bethe Theory -- Appendix B. Computer Programs -- B.1. Matrix Deconvolution -- B.2. Fourier-Log Deconvolution -- B.3. Kramers -- Kronig Analysis and Thickness Determination -- B.4. Fourier-Ratio Deconvolution -- B.5. Incident-Convergence Correction -- B.9. Lenz Elastic and Inelastic Cross Sections -- B.10. Conversion between Oscillator Strength and Cross Section -- B.11. Conversion between Mean Energy and Inelastic Mean Free Path -- Appendix C. Plasmon Energies of Some Elements and Compounds -- Appendix D. Inner-Shell Energies and Edge Shapes -- Appendix E. Electron Wavelengths and Relativistic Factors; Fundamental Constants -- References
Control code
ocn851789076
Dimensions
unknown
Edition
Second edition
Extent
1 online resource (xi, 485 pages)
File format
unknown
Form of item
online
Isbn
9781475750997
Level of compression
uncompressed
Note
SpringerLink
Quality assurance targets
unknown
Reformatting quality
access
Sound
unknown sound
Specific material designation
remote
System control number
(OCoLC)851789076

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